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Fault Diagnosis and Tolerance in Cryptography: Third International Workshop, Fdtc 2006, Yokohama, Japan, October 10, 2006, Proceedings Paperback - 2006
by Luca Breveglieri (Editor); Israel Koren (Editor); David Naccache (Editor)
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- Title Fault Diagnosis and Tolerance in Cryptography: Third International Workshop, Fdtc 2006, Yokohama, Japan, October 10, 2006, Proceedings
- Author Luca Breveglieri (Editor); Israel Koren (Editor); David Naccache (Editor)
- Binding Paperback
- Edition 1st
- Pages 258
- Volumes 1
- Language ENG
- Publisher Springer, New York
- Date 2006-09-28
- ISBN 9783540462507 / 3540462503
- Weight 0.89 lbs (0.40 kg)
- Dimensions 9.26 x 6.22 x 0.61 in (23.52 x 15.80 x 1.55 cm)
- Library of Congress Catalog Number 2006933937
- Dewey Decimal Code 005.820
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Fault Diagnosis and Tolerance in Cryptography: Third International Workshop, FDTC 2006, Yokohama, Japan, October 10, 2006, Proceedings (Lecture Notes in Computer Science / Security and Cryptology)
by Breveglieri, Luca [Editor]; Koren, Israel [Editor]; Naccache, David [Editor]; Seifert, Jean-Pierre [Editor];
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Fault Diagnosis and Tolerance in Cryptography : Third International Workshop, FDTC 2006, Yokohama, Japan, October 10, 2006, Proceedings
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Fault Diagnosis and Tolerance in Cryptography
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Fault Diagnosis and Tolerance in Cryptography: Third International Workshop, FDTC 2006, Yokohama, Japan, October 10, 2006, Proceedings
by Luca Breveglieri
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Paperback / softback. New. This book constitutes the refereed proceedings of the Third International Workshop on Fault Diagnosis and Tolerance in Cryptography, FDTC 2006, held in Yokohama, Japan in October 2006. The 12 revised papers of FDTC 2006 are presented together with nine papers from FDTC 2004 and FDTC 2005 that passed a second round of reviewing.
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FAULT DIAGNOSIS AND TOLERANCE IN CRYPTOGRAPHY
by LUCA BREVEGLIERI , ISRAEL KOREN ,
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Fault Diagnosis and Tolerance in Cryptography: Third International Workshop, FDTC 2006, Yokohama, Japan, October 10, 2006, Proceedings (Lecture Notes in Computer Science, 4236)
by Breveglieri, Luca [Editor]; Koren, Israel [Editor]; Naccache, David [Editor]; Seifert, Jean-Pierre [Editor];
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