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Springer, 2006-06-26. Paperback. Very Good. 6x0x9. Ex-library paperback in very nice condition with the usual markings and attachments.
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Combinatorial Pattern Matching: 17th Annual Symposium, CPM 2006, Barcelona, Spain, July 5-7, 2006, Proceedings Paperback - 2006 - 2006th Edition
by Moshe Lewenstein (Editor); Gabriel Valiente (Editor)
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- Title Combinatorial Pattern Matching: 17th Annual Symposium, CPM 2006, Barcelona, Spain, July 5-7, 2006, Proceedings
- Author Moshe Lewenstein (Editor); Gabriel Valiente (Editor)
- Binding Paperback
- Edition number 2006th
- Edition 2006
- Pages 420
- Volumes 1
- Language ENG
- Publisher Springer, Berlin, Germany
- Date 2006-06-26
- ISBN 9783540354550 / 3540354557
- Weight 1.34 lbs (0.61 kg)
- Dimensions 9.21 x 6.14 x 0.89 in (23.39 x 15.60 x 2.26 cm)
- Dewey Decimal Code 004
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Combinatorial Pattern Matching: 17th Annual Symposium, CPM 2006, Barcelona, Spain, July 5-7, 2006, Proceedings (Lecture Notes in Computer Science / Theoretical Computer Science and General Issues)
by Lewenstein, Moshe [Editor]; Valiente, Gabriel [Editor];
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Combinatorial Pattern Matching: 17Th Annual Symposium, Cpm 2006, Barcelona, Spain, July 5-7, 2006, Proceedings
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Combinatorial Pattern Matching: 17Th Annual Symposium, Cpm 2006, Barcelona, Spain, July 5-7, 2006
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Combinatorial Pattern Matching : 17th Annual Symposium, CPM 2006, Barcelona, Spain, July 5-7, 2006, Proceedings
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Combinatorial Pattern Matching: 17th Annual Symposium, CPM 2006, Barcelona, Spain, July 5-7, 2006, Proceedings
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Paperback / softback. New. The book presents 33 revised full papers together with 3 invited talks, organized in topical sections on data structures, indexing data structures, probabilistic and algebraic techniques, applications in molecular biology, string matching, data compression, and dynamic programming.
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Combinatorial Pattern Matching 17Th Annual Symposium Cpm 2006 Barcelona Spain July 57 2006 Proceedings 2006
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Combinatorial Pattern Matching: 17Th Annual Symposium, Cpm 2006, Barcelona, Spain, July 5-7, 2006, Proceedings
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Combinatorial Pattern Matching: 17Th Annual Symposium, Cpm 2006, Barcelona, Spain, July 5-7, 2006, Proceedings
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