Nanoscale Characterisation of Ferroelectric Materials: Scanning Probe Microscopy Approach Hardcover - 2004
by Marin Alexe (Editor); Alexei Gruverman (Editor)
First line
Recent progress in oxide electronic devices including microelectromechanical systems (MEMS), non-volatile ferroelectric memories (FeRAMs), and ferroelectric heterostructures necessitates an understanding of local ferroelectric properties on the nanometer level.
From the rear cover
This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric domains in SPM, quantitative analysis of the piezoresponse signals as well as basic physics of ferroelectrics at the nanoscale level, such as nanoscale switching, scaling effects, and transport behavior. This state-of-the-art review of theory and experiments on nanoscale polarization phenomena will be a useful reference for advanced readers as well for newcomers and graduate students interested in the SPM techniques. The non-specialists will obtain valuable information about different approaches to electrical characterization by SPM, while researchers in the ferroelectric field will be provided with details of SPM-based measurements of ferroelectrics.
Details
- Title Nanoscale Characterisation of Ferroelectric Materials: Scanning Probe Microscopy Approach
- Author Marin Alexe (Editor); Alexei Gruverman (Editor)
- Binding Hardcover
- Edition 1St
- Pages 282
- Volumes 1
- Language ENG
- Publisher Springer, Secaucus, New Jersey, U.S.A.
- Date 2004-04-06
- Illustrated Yes
- Features Illustrated, Index, Table of Contents
- ISBN 9783540206620 / 3540206620
- Weight 1.2 lbs (0.54 kg)
- Dimensions 9.4 x 6.3 x 0.7 in (23.88 x 16.00 x 1.78 cm)
- Library of Congress subjects Nanotechnology, Nanostructured materials
- Library of Congress Catalog Number 2004040666
- Dewey Decimal Code 620.5
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