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Measuring Success: Testing, Grades, and the Future of College Admissions Hardcover - 2017
by Jack Buckley (Editor); Lynn Letukas (Editor); Ben Wildavsky (Editor)
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- Title Measuring Success: Testing, Grades, and the Future of College Admissions
- Author Jack Buckley (Editor); Lynn Letukas (Editor); Ben Wildavsky (Editor)
- Binding Hardcover
- Pages 344
- Volumes 1
- Language ENG
- Publisher Johns Hopkins University Press
- Date 2017-12
- Features Bibliography, Index
- ISBN 9781421424965 / 1421424967
- Weight 1.19 lbs (0.54 kg)
- Dimensions 8.9 x 6 x 1.2 in (22.61 x 15.24 x 3.05 cm)
- Library of Congress subjects EDUCATION / Higher, EDUCATION / Testing & Measurement
- Library of Congress Catalog Number 2017035199
- Dewey Decimal Code 378.166
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Measuring Success: Testing, Grades, and the Future of College Admissions
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Measuring Success: Testing, Grades, and the Future of College Admissions
by Buckley, Jack, Letukas, Lynn, Wildavsky, Ben
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Johns Hopkins University Press. Good. Good. Ship within 24hrs. Satisfaction 100% guaranteed. APO/FPO addresses supported
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Measuring Success: Testing, Grades, and the Future of College Admissions
by Jack Buckley
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Hardback. New. Shaw, Kyle Sweitzer, Roger J. Thompson, Meredith Welch, Rebecca Zwick
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Measuring Success � Testing, Grades, and the Future of College Admissions
by Buckley, Jack (Editor)/ Letukas, Lynn (Editor)/ Wildavsky, Ben (Editor)
- New
- Hardcover
- Condition
- New
- Binding
- Hardcover
- ISBN 10 / ISBN 13
- 9781421424965 / 1421424967
- Quantity Available
- 1
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Exeter, Devon, United Kingdom
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€60.13€11.86 shipping to USA
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Johns Hopkins Univ Pr, 2018. Hardcover. New. 344 pages. 9.00x6.00x1.06 inches.
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€60.13
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