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Measuring Success: Testing, Grades, and the Future of College Admissions
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Measuring Success: Testing, Grades, and the Future of College Admissions Hardcover - 2017

by Jack Buckley (Editor); Lynn Letukas (Editor); Ben Wildavsky (Editor)


Details

  • Title Measuring Success: Testing, Grades, and the Future of College Admissions
  • Author Jack Buckley (Editor); Lynn Letukas (Editor); Ben Wildavsky (Editor)
  • Binding Hardcover
  • Pages 344
  • Volumes 1
  • Language ENG
  • Publisher Johns Hopkins University Press
  • Date 2017-12
  • Features Bibliography, Index
  • ISBN 9781421424965 / 1421424967
  • Weight 1.19 lbs (0.54 kg)
  • Dimensions 8.9 x 6 x 1.2 in (22.61 x 15.24 x 3.05 cm)
  • Library of Congress subjects EDUCATION / Higher, EDUCATION / Testing & Measurement
  • Library of Congress Catalog Number 2017035199
  • Dewey Decimal Code 378.166

About the author

Jack Buckley is the senior vice president of research and evaluation at the American Institutes for Research and a research associate professor of applied statistics at New York University. He is the coauthor of Charter Schools: Hope or Hype? Lynn Letukas is an associate research scientist at the College Board. She is the author of Primetime Pundits: How Cable News Covers Social Issues. Ben Wildavsky is senior fellow and executive director at the College Board Policy Center. He is the author of The Great Brain Race: How Global Universities are Reshaping the World.

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Measuring Success: Testing, Grades, and the Future of College Admissions
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Measuring Success: Testing, Grades, and the Future of College Admissions
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Measuring Success: Testing, Grades, and the Future of College Admissions

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Measuring Success � Testing, Grades, and the Future of College Admissions
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Measuring Success � Testing, Grades, and the Future of College Admissions

by Buckley, Jack (Editor)/ Letukas, Lynn (Editor)/ Wildavsky, Ben (Editor)

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