Description:
Washington, DC: ITC, 1999. Hardcover. Near fine condition. [8.5" x 11"]. 1163pp.
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Test Conference, IEEE International Hardcover - 1999
by IEEE Computer Society
Details
- Title Test Conference, IEEE International
- Author IEEE Computer Society
- Binding Hardcover
- Edition 1st
- Pages 1163
- Volumes 1
- Language ENG
- Publisher Institute of Electrical & Electronics Enginee, Piscataway, NJ, U.S.A.
- Date 1999-08
- ISBN 9780780357549 / 078035754X
- Library of Congress subjects Electronic digital computers - Circuits -, Integrated circuits - Testing
- Library of Congress Catalog Number 00703275
- Dewey Decimal Code 621.381
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Proceedings International Test Conference 1999
by IEEE
- Used
- Hardcover
- Condition
- Used - Near fine condition
- Binding
- Hardcover
- ISBN 10 / ISBN 13
- 9780780357549 / 078035754X
- Quantity Available
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€13.98€4.66 shipping to USA
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