Description:
McGraw-Hill Professional Publishing, 1998. 2. Hardcover. Good. Good+; Hardcover; 2nd Edition; Withdrawn library copy with the standard library markings; Light wear to the covers; Library stamps to the endpapers; Text pages are clean & unmarked; Binding is excellent with a straight spine; This book will be shipped in a sturdy cardboard box with foam padding; Medium Format (8.5" - 9.75" tall); 1.9 lbs; Purple, blue, and black covers with title in white lettering; 1998, McGraw-Hill Professional Publishing; 454 pages; "Semiconductor Measurements and Instrumentation," by W. R. Runyan, et al.
Stock Photo: Cover May Be Different
Semiconductor Measurements and Instrumentation Hardcover - 1998 - 2nd Edition
by W. R. Runyan; T. J. Shaffner (With)
Details
- Title Semiconductor Measurements and Instrumentation
- Author W. R. Runyan; T. J. Shaffner (With)
- Binding Hardcover
- Edition number 2nd
- Edition 2
- Pages 453
- Volumes 1
- Language ENG
- Publisher McGraw-Hill Professional Publishing
- Date 1998-02
- Illustrated Yes
- ISBN 9780070576971 / 0070576971
- Weight 1.88 lbs (0.85 kg)
- Dimensions 9.33 x 6.27 x 1.52 in (23.70 x 15.93 x 3.86 cm)
- Library of Congress subjects Semiconductors, Physical measurements
- Library of Congress Catalog Number 97026081
- Dewey Decimal Code 621.381
More Copies for Sale
Stock Photo: Cover May Be Different
Semiconductor Measurements and Instrumentation
by W. R. Runyan, et al
- Used
- Good
- Hardcover
- Condition
- Used - Good
- Edition
- 2
- Binding
- Hardcover
- ISBN 10 / ISBN 13
- 9780070576971 / 0070576971
- Quantity Available
- 1
- Seller
-
Bellingham, Washington, United States
- Item Price
-
€137.79€3.73 shipping to USA
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Item Price
€137.79
€3.73
shipping to USA