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Oxide Reliability: A Summary of Silicon Oxide Wearout, Breakdown, and Reliability (Selected Topics in Electronics and Systems)
by Dumin, David J (Editor)
- Used
- Hardcover
- Condition
- See description
- ISBN 10
- 9810248423
- ISBN 13
- 9789810248420
- Seller
-
Hull, Massachusetts, United States
Payment Methods Accepted
About This Item
Hardcover. Book Condition: Fine. Jacket Condition: Very Good. World Scientific Publishing Company, 2002. 280 pages. Nice Firm Clean copy ! Jacket has 1 short tear. Size: 10 x 6.7 x 0.7. Engineering Science/Nature::Chemistry 6039L
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Details
- Bookseller
- BookScene (US)
- Bookseller's Inventory #
- 135415
- Title
- Oxide Reliability: A Summary of Silicon Oxide Wearout, Breakdown, and Reliability (Selected Topics in Electronics and Systems)
- Author
- Dumin, David J (Editor)
- Book Condition
- Used
- Binding
- Hardcover
- ISBN 10
- 9810248423
- ISBN 13
- 9789810248420
- Publisher
- World Scientific Publishing Company
- This edition first published
- January 31, 2002
- Bookseller catalogs
- Engineering;
Terms of Sale
BookScene
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