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Nanometer Technology Designs: High-Quality Delay Tests (Frontiers in Electronic Testing)
by Ahmed, Nisar
- Used
- Hardcover
- Condition
- Like New
- ISBN 10
- 0521801737
- ISBN 13
- 9780521801737
- Seller
-
Port Tobacco, Maryland, United States
Payment Methods Accepted
About This Item
Springer, 2007-12-20. Hardcover. Like New. 0.9000 9.3000 6.3000. Hardcover. No noticeable cover wear. Has remainder mark. Clean unmarked text. Tight binding.
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Details
- Bookseller
- Dewey Books PTMD (US)
- Bookseller's Inventory #
- mon0000013066
- Title
- Nanometer Technology Designs: High-Quality Delay Tests (Frontiers in Electronic Testing)
- Author
- Ahmed, Nisar
- Format/Binding
- Hardcover
- Book Condition
- New
- Quantity Available
- 1
- ISBN 10
- 0521801737
- ISBN 13
- 9780521801737
- Publisher
- Springer
- Place of Publication
- Cambridge
- Date Published
- 2007-12-20
- Bookseller catalogs
- Book;
- Size
- 0.9000 9.3000 6.3000
Terms of Sale
Dewey Books PTMD
30 day return guarantee, with full refund including original shipping costs for up to 30 days after delivery if an item arrives incorrectly described or damaged.
About the Seller
Dewey Books PTMD
Biblio member since 2021
Port Tobacco, Maryland
About Dewey Books PTMD
Dewey Books PTMD sells new and used books and ships via USPS Monday thru Friday, excluding holidays.
Glossary
Some terminology that may be used in this description includes:
- Tight
- Used to mean that the binding of a book has not been overly loosened by frequent use.
- Remainder Mark
- Usually an ink marking of some sort which indicates that the book was designated a remainder. In most cases, it can be found on...
- New
- A new book is a book previously not circulated to a buyer. Although a new book is typically free of any faults or defects, "new"...