Materials Reliability in Microelectronics IV: Volume 338 (MRS Proceedings) by Peter Børgesen (Editor), John C. Coburn (Editor), William F. Filter (Editor), John E. Sanchez Jr. (Editor), Kenneth P. Rodbell (Editor) - 1994-10-19
by Peter Børgesen (Editor), John C. Coburn (Editor), William F. Filter (Editor), John E. Sanchez Jr. (Editor), Kenneth P. Rodbell (Editor)
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Materials Reliability in Microelectronics IV: Volume 338 (MRS Proceedings)
by Peter Børgesen (Editor), John C. Coburn (Editor), William F. Filter (Editor), John E. Sanchez Jr. (Editor), Kenneth P. Rodbell (Editor)
- Used
- Hardcover
Materials Research Society, 1994-10-19. Hardcover. Used:Good.
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Bookseller
Ergodebooks
(US)
- Format/Binding Hardcover
- Book Condition Used:Good
- Quantity Available 1
- Binding Hardcover
- ISBN 10 1558992383
- ISBN 13 9781558992382
- Publisher Materials Research Society
- Date Published 1994-10-19