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Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks
by David H. Krinsley; Kenneth Pye; Sam Boggs Jr; N. Keith Tovey
- Used
- good
- Hardcover
- Condition
- Good
- ISBN 10
- 0521453461
- ISBN 13
- 9780521453462
- Seller
-
HOUSTON, Texas, United States
Payment Methods Accepted
About This Item
Cambridge University Press, 1998-07-13. Hardcover. Good.
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Details
- Bookseller
- Ergodebooks (US)
- Bookseller's Inventory #
- SONG0521453461
- Title
- Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks
- Author
- David H. Krinsley; Kenneth Pye; Sam Boggs Jr; N. Keith Tovey
- Format/Binding
- Hardcover
- Book Condition
- Used - Good
- Quantity Available
- 1
- ISBN 10
- 0521453461
- ISBN 13
- 9780521453462
- Publisher
- Cambridge University Press
- Place of Publication
- Cambridge
- Date Published
- 1998-07-13
Terms of Sale
Ergodebooks
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About the Seller
Ergodebooks
Biblio member since 2005
HOUSTON, Texas
About Ergodebooks
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